| About K-MAC > Business Area |
| Business Area |
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Materials Analysis & consulting Service |
The affiliated 'Korea Materials & Analysis Center', and High-Qualified Experts for Consulting Services
Consignment Research and Consignment Development Services
Experimental Method Development for Surface Metrology and Material Composition Analysis
Technical Advice Services for New Product Development |
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Process Monitoring System for Semiconductor and FPD |
Thin Film Thickness Measurement System
Color Measurement System
3D Optical Profiler
Contact Angle Measurement
Sheet Resistance Measurement
Transmittance Measurement
Optical Density Measurement |
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Core Component Development & Production |
CCD Array for UV-Vis Spectrometer
Optical Component By MEMS
Light Sources (Tungsten-Halogen, LED, IR, and etc.)
Accessories for Analytical Instruments: Beam Splitter, Connectors, Sample Holder, Reducer, etc.
Optical Fiber, and others |
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Analysis and Measeurment System Development & Production |
Miniature UV-Vis Spectrometer
Thin Film Thickness Measurement System
Color Measurement System
3D Surface Metrology Profiler
Surface Plasmon Resonance System
Fluorescence Spectrometer, and Scanner
In-Vitro Diagnosis Analyzer |
